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FEI Co


5350 NE Dawson Creek Dr
Hillsboro, OR 97124 United States
Phone:(503) 726-7500
Toll Free Number:(866) 693-3426
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Overview: FEI is the world leader in the production and distribution of electron microscopes, including scanning electron microscopes (SEM), transmission electron microscopes (TEM), DualBeam­ instruments, and focused ion beam tools (FIB), for nanoscale research, serving a broad range of customers worldwide. Nanotechnology is the science of finding, characterizing, analyzing and fabri­cating materials smaller than 100 nano­meters (a nanometer is one billionth of a meter). FEI's global customer base includes researchers, scientists, engineers, lab managers, and other skilled professionals.
FEI manufactures complete microscope solutions that serve the Research, Natural Resources, Electronics, Life Sciences. FEI's market-leading instruments include the latest in ion-­ and electron­-beam technologies. FEI produces cutting-edge tools that are revolutionizing nanoscale exploration from the classroom to the laboratory to the clean room. FEI is bringing the nanoscale within the grasp of leading researchers and manufacturers, and helping them turn some of the biggest ideas of this century into reality. FEI maintains research and development centers in North America, Europe, and Asia, and sales and service operations in more than 50 countries around the world.
UMDC Code: 345059
Fax: (503) 726-2570
Email: sales@feico.com
Website: http://www.fei.com
Company Type: Private
Business Started: 1971
Business Lines: Manufacturer/Exporter
Sales Channels: Direct/Distributors
Related Company: FEI Europe bv
FEI Deutschland GmbH
FEI France
FEI UK Ltd
FEI Italia srl
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Inspect Scanning Electron Microscope
The Inspect line of tools includes two scanning electron microscopes , one SEM with tungsten and another SEM with FEG, for use where high-resolution imaging is routine. These cost-effective, flexible, state-of-the-art scanning electron microscopes are built using FEIs advanced technology, making them valuable for industrial manufacturers and researchers working with material characterization and inspection applications.
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Magellan XHR Scanning Electron Microscope
The Magellan XHR SEM family of scanning electron microscopes (SEM) enables scientists and engineers to quickly see things they could not see before: highly-sensitive surface images, looking top-down or at an angle, and at resolutions below one nanometer
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Morgagni Transmission Electron Microscope
The Morgagni TEM is an affordable, state-of-the-art transmission electron microscope that offers remarkable ease-of-use, yet meets the stringent application demands in the areas of cell biological research and diagnostic screening as well as pharmaceutical and industrial applications. The Morgani TEM is perfectly suited for studying underlying fundamental cell biological processes, as part of pathological and physiological pathways or pharmaceutical tests for new medications.
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Nova NanoSEM Scanning Electon Microscope
With the Nova NanoSEM 50 series, even more becomes possible. In addition to the powerful combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration.
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Quanta Scanning Electron Microscope
The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction.
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Tecnai Transmission Electron Microscope
Fundamental research within the scope of cell biology, structural biology, soft matter and (bio)-nanotechnology requires investigations down to the atomic level.
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Titan Transmission Electron Microscope
The Titan is the first and only S/TEM designed to fully realize the benefits of corrected S/TEM. Aberration correction breaks through the fundamental optical limitations of magnetic lenses, but requires equally fundamental changes in system design to achieve the stability required for ultra high resolution imaging and analysis.
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Verios XHR Scanning Electron Microscope
The Verios is the second generation of FEIs leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications.
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Product Literature/Brochure:

Magellan XHR Scanning Electron Microscope
Low voltage SEM is widely acknowledged to provide characterization with reduced sample charging for nonconducting materials, reduced damage of delicate samples, and enhanced surface sensitivity, due to the signi cantly
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Morgagni Transmission Electron Microscope
Since becoming commercially available, about 50 years ago, the transmission electron microscope (TEM) has had an enormous impact on our understanding of living cells.
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Product Specifications:

Verios XHR Scanning Electron Microscope
The Verios is the second generation of FEIs leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Nova NanoSEM Scanning Electon Microscope
With the Nova NanoSEM 50 series, even more becomes possible. In addition to the powerful combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration, the Nova NanoSEM 50 series introduces a new suite of latest generation, high sensitivity retractable SE/BSE and STEM detectors, as well as versatile SE/BSE filtering capabilities, to best optimize the information of interest. Intelligent scanning modes are available to minimize imaging artifacts.
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Quanta Scanning Electron Microscope
The Quanta TMseries from FEI is the advanced, flexiblesolution for current and future diagnostics applications.Featuring three imaging modes-high-vacuum, lowvacuum and ESEM TMit accommodates the widest rangeof samples of any SEM system. It is engineered to providemaximum data-imaging and microanalysis-from allspecimens, with or without preparation.
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Inspect Scanning Electron Microscope
Tailored for the mainstream need to investigate a wide variety of materials and characterize their structure and composition, the easy to use Inspect TM S50 provides flexibility and versatility to handle most research needs. The Inspect provides all the data: surface and compositional images can be combined with elemental analysis for determining material properties and elemental composition.
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Titan Transmission Electron Microscope
Nanoresearch strives to increase our understanding of nanostructures and functional materials by linking the macroscopic material properties to the properties at the smallest level of detail: down to atoms. This continuing drive pushes for the better understanding of local atom organization and for the characterization of atoms, chemical bonding and even the electronic structure.
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Tecnai Transmission Electron Microscope
Tecnai G2 series combines mature imaging and analysis technologies continuously with novel and advanced capabilities that push the performance of (S)TEM technology and its applications. It features proven advanced optics and techniques which underline FEIs commitment to furthering (S)TEM some of which include: monochromators for unprecedented high resolution analysis
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