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Magellan XHR Scanning Electron Microscope

Company : FEI Co

UMDC Code : 345059

The Magellan XHR SEM family of scanning electron microscopes (SEM) enables scientists and engineers to quickly see things they could not see before: highly-sensitive surface images, looking top-down or at an angle, and at resolutions below one nanometer. This important breakthrough in electron microscopy is made possible thanks to the revolutionary monochromatized gun of the Magellan XHR SEM column, which enables microscopists to associate high spatial resolution with very shallow beam penetration.

Product URL : http://www.fei.com/products/scanning-electron-micr
oscopes/magellan.aspx

Last Updated : 03/16/2013

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