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Verios XHR Scanning Electron Microscope

Company : FEI Co

UMDC Code : 345059

The Verios is the second generation of FEIs leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).

Product URL : http://www.fei.com/products/scanning-electron-micr

Last Updated : 03/16/2013

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