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45201, DSR-λ Multiple Wavelength Automatic Refractometer

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Product Literature/Brochure from VEE GEE Scientific Inc

The DSR-λ Multiple Wavelength Automatic Refractometer from Schmidt+Haensch is the worlds first instrument to offer multiple wavelength measurement of refractive index at the digital, automatic level. Refractometers measure the critical angle of total reflection and calculate the refractive index from this value. The R.I. of a substance depends on the wavelength of light and usually increases at smaller wavelengths. For a better characterization of this behavior, Ernst Abbe introduced in the late 19th century what became known as the Abbe Number; its an arithmetically dimensionless value calculated from measured refractive indices at 486.1, 589.3, and 656.3nm.

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